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Nombre de notices
277
Mots-clés
Mott insulator
Aryl-diazonium salts
Chemical detection
A Thin films
Amorphous
Films
Mott insulators
Applications industrielles
Selenization
Carbon nitride
B2 Quaternary
A1 Characterization
Alzheimer's disease
Plasma etching
Physical vapor deposition
Chalcogenides
Atomic force microscopy
A3 Physical vapor deposition processes
Sol-gel
A-CNx
TiO2
Oxides
Ablation laser
Buffer Couple
X-ray photoelectron spectroscopy
C Photoelectron spectroscopy
Copper
Carbon nanotubes
Atomic layer etching
AZO thin films
Transfert d'énergie
Bipolar resistive switching BRS
Thin films
Sputtering
Plasmas froids
Etching
Semiconductors
Nanocomposite
Residual stress
Band alignment
Amyloid precursor
Optical properties
B Chemical synthesis
NEXAFS
Chalcogenide glass
Non-volatile memory
Alloying
TEM
A Chalcogenides
Thin film
Structure
BOMBARDMENT
B1 Inorganic compounds
Cathepsin
Ambipolar material
Resistive switching
Biocapteurs
Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation
Biomasse
Carbon Nanotube
AuCu alloy
CaTiO3Pr^3^+
Bixbyite
V2O3
Aluminium nitride
Adsorption
CNTs’ collapse
Calcined clay
CH4
B2 Semiconducting alloys
Functionalization
AlN
Nanotubes
SF 6
Capacitance
XPS
B2 Semiconducting indium compounds
Kirkendall effect
CHLORINE PLASMAS
X-ray diffraction
Biofilms microbiens
Colloidal solution
B3 Solar cells
Chemical and biological sensors
Band gap
CIGSe
Anatase
Avalanche breakdown
Transmission electron microscopy
Chalcogenide
Titanium dioxide
PECVD
A Multilayers
Spectroscopic ellipsometry
3 nm in size
Magnetron sputtering
Carbon
Low-pressure plasma processing
Vanadium Sesquioxide
Scanning electron microscopy